The spatial and angular Goos-Hanchen (GH) and Imbert-Fedorov (IF) shifts are examined for fundamental Gaussian beam (633 nm) reflected from a monolayer of MoS2 using the 'Stokes polarimetric' technique. This technique enables us to promptly determine the magnitudes of the reflection coefficients and their relative phase differences which gives the optical beam shifts. The GH and IF shifts are measured with different polarization basis along with varying angle of incidence. This is a precision technique depending only upon the polarization components of the light beam and is quite independent of the fluctuations of the light intensity. The response of GH and IF shifts for MoS2 substrate is significant and thus may open up new possibilities in the optical applications of 2D materials.

中文翻译：

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使用偏振技术研究单层 MoS2 的光束位移

使用“斯托克斯偏振”技术检查从单层 MoS2 反射的基本高斯光束 (633 nm) 的空间和角度 Goos-Hanchen (GH) 和 Imbert-Fedorov (IF) 位移。这种技术使我们能够迅速确定反射系数的大小及其产生光束位移的相对相位差。GH 和 IF 偏移是在不同的偏振基础和不同的入射角下测量的。这是一种精密技术，仅取决于光束的偏振分量，并且与光强度的波动完全无关。GH 和 IF 位移对 MoS2 衬底的响应是显着的，因此可能为二维材料的光学应用开辟新的可能性。