The L₁, L₂ and L₃ subshells of Hf, Ta and Re atoms have been excited selectively by using microprobe XRF beam line, Indus‐2, RRCAT, India. The consequent characteristic L X‐ray photons, emitted from the targets due to creations of vacancies in L subshells, are measured using silicon drift detector (X‐123) spectrometer. As the energy of synchrotron radiation increases, the contribution of characteristic L X‐ray intensity increases. The advantage of the increase in the intensity of the characteristic L X‐ray photons with an increase in the energy of synchrotron radiation has been used to determine the L subshell fluorescence yield ratios of Hf, Ta and Re atoms by adopting the selective excitation method. The measured ratios of L subshell fluorescence yield have been compared with theoretical and other experimental values.

中文翻译：

---

用选择性激发法测定某些高Z元素的L亚壳荧光产率。

L ₁，L ₂和L ₃通过使用印度RRCAT的Indus-2微型探针XRF射线线，有选择地激发了Hf，Ta和Re原子的亚壳。使用硅漂移检测器（X-123）光谱仪测量由于L子壳中的空位而从目标发出的随之产生的特征性LX射线光子。随着同步加速器辐射的能量增加，特征LX射线强度的贡献增加。通过采用选择性激发方法，特征LX射线光子强度的增加和同步加速器辐射能量的增加的优势已被用来确定Hf，Ta和Re原子的L子壳荧光产率。测得的L亚壳荧光产量的比率已与理论值和其他实验值进行了比较。