Abstract High voltage stress at the rear side of bifacial PERC cells leads to severe power losses. In contrast to monofacial PERC solar cells, reversible de-polarization related potential induced degradation (PID-p) and irreversible corrosive potential induced degradation (PID-c) can occur. Our results show that a reliable assessment of the solar cells power losses requires a modified PID test method which includes illumination in addition to the high voltage stress test. Furthermore, a recovery step needs to be added to the test scheme to separate reversible PID-p contributions from irreversible PID-c damages. We show that both, the degree of degradation as well as the contributions of PID-p and PIC-c depend sensitively on the solar cell under consideration. Thus, we propose to include both illumination during PID stress as well as a recovery step in the PID test scheme for bifacial PERC cells. Additionally, we show that the most sensitive cell parameter for the detection of rear side PID is given by the rear side measurement of the short circuit current. Finally, we present results showing that a 0.1 sun illumination during this characterization step is sufficient for an assessment of the PID. Based on these results, we propose a test setup which combines the required stress test conditions with an in-situ tracking of the PID.

中文翻译：

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双面PERC太阳能电池可逆和不可逆PID快速测试

摘要 双面PERC电池背面的高压应力会导致严重的功率损耗。与单面 PERC 太阳能电池相比，可逆去极化相关电位诱导退化 (PID-p) 和不可逆腐蚀电位诱导退化 (PID-c) 可能发生。我们的结果表明，太阳能电池功率损耗的可靠评估需要改进的 PID 测试方法，该方法除了高压应力测试外还包括照明。此外，需要在测试方案中添加一个恢复步骤，以将可逆的 PID-p 贡献与不可逆的 PID-c 损坏分开。我们表明，退化程度以及 PID-p 和 PIC-c 的贡献都敏感地取决于所考虑的太阳能电池。因此，我们建议在双面 PERC 电池的 PID 测试方案中包括 PID 应力期间的照明以及恢复步骤。此外，我们表明，用于检测背面 PID 的最敏感的电池参数是由短路电流的背面测量值给出的。最后，我们展示的结果表明，在此表征步骤中 0.1 的太阳光照足以评估 PID。基于这些结果，我们提出了一种测试设置，它将所需的压力测试条件与 PID 的原位跟踪相结合。在此表征步骤期间的 1 个太阳光照足以评估 PID。基于这些结果，我们提出了一种测试设置，它将所需的压力测试条件与 PID 的原位跟踪相结合。在此表征步骤期间的 1 个太阳光照足以评估 PID。基于这些结果，我们提出了一种测试设置，它将所需的压力测试条件与 PID 的原位跟踪相结合。