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Investigation of fT-Doubler Technique to Improve RF Performance of Inverse-Mode SiGe HBTs
IEEE Microwave and Wireless Components Letters ( IF 3 ) Pub Date : 2020-09-01 , DOI: 10.1109/lmwc.2020.3010538
Md Arifur R. Sarker , Anup P. Omprakash , Moon-Kyu Cho , John D. Cressler , Ickhyun Song

This letter presents the application of the $f_{\mathrm {T}}$ -doubler technique, for the first time, to improve the unity-gain frequency $(f_{\mathrm {T}})$ of inverse-mode (IM) silicon–germanium (SiGe) heterojunction bipolar transistors (HBTs). An $f_{T}$ -doubler structure, which used three identical SiGe HBTs with the same emitter area of 0.07 (width) $\times0.9$ (length) $\mu \text{m}^{2}$ , is implemented in a commercial 0.13- $\mu \text{m}$ SiGe-BiCMOS technology platform. A peak $f_{\mathrm {T}}$ of 77 GHz is extrapolated for the IM $f_{\mathrm {T}}$ doubler, whereas a peak $f_{\mathrm {T}}$ of a single IM SiGe HBT is found to be 53 GHz, exhibiting an increase of about 46% in $f_{\mathrm {T}}$ from the $f_{\mathrm {T}}$ -doubler technique. The maximum oscillation frequency of the IM $f_{\mathrm {T}}$ doubler using Mason’s unilateral gain is about 158 GHz. In addition, small-signal model parameters of the IM $f_{\mathrm {T}}$ doubler are presented, which show the IM $f_{\mathrm {T}}$ -doubler structures can be treated as a single transistor element for high-frequency circuit design.

中文翻译:

研究 fT 倍频器技术以提高反模式 SiGe HBT 的射频性能

这封信提出了应用 $f_{\mathrm {T}}$ - 倍频技术,首次提高单位增益频率 $(f_{\mathrm {T}})$ 反模式 (IM) 硅锗 (SiGe) 异质结双极晶体管 (HBT)。一个 $f_{T}$ -倍增结构,使用三个相同的 SiGe HBT,发射极面积相同,为 0.07(宽度) $\times0.9$ (长度) $\mu \text{m}^{2}$ , 在商业 0.13- $\mu \text{m}$ SiGe-BiCMOS 技术平台。一个顶峰 $f_{\mathrm {T}}$ 为 IM 外推 77 GHz $f_{\mathrm {T}}$ 倍增,而峰值 $f_{\mathrm {T}}$ 发现单个 IM SiGe HBT 的频率为 53 GHz,增加了约 46% $f_{\mathrm {T}}$ 来自 $f_{\mathrm {T}}$ - 倍增技术。IM的最大振荡频率 $f_{\mathrm {T}}$ 使用梅森单边增益的倍频器约为 158 GHz。另外,IM的小信号模型参数 $f_{\mathrm {T}}$ 呈现倍增器,显示 IM $f_{\mathrm {T}}$ -倍频器结构可以被视为高频电路设计的单个晶体管元件。
更新日期:2020-09-01
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