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From the EIC: Special Issue on VTS
IEEE Design & Test ( IF 2 ) Pub Date : 2020-09-03 , DOI: 10.1109/mdat.2020.3016763
Jorg Henkel

In IEEE Design&Test tradition of covering top test conferences, the guest editors Stefano Di Carlo, Peilin Song, and Vivek Chickermane present the special issue on VTS 2019 with its highlights from testing, reliability, and security covering approximate computing, neuromorphic computing, and quantum computing. Many thanks to the guest editors for presenting the newest trends in test.

中文翻译:

来自EIC:VTS特刊

在IEEE中 设计与测试客座编辑Stefano Di Carlo,Peilin Song和Vivek Chickermane都是报道顶级测试会议的传统,他在VTS 2019上发表了特刊,其重点是测试,可靠性和安全性,涵盖了近似计算,神经形态计算和量子计算。非常感谢来宾编辑介绍了最新的测试趋势。
更新日期:2020-09-05
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