The NUMEN (NUclear Matrix Elements for Neutrinoless double beta decay) project was recently proposed with the aim to investigate the nuclear response to Double Charge Exchange reactions for all the isotopes explored by present and future studies of 0νββ decay. The expected level of radiation in the NUMEN experiment imposes severe limitations on the average lifetime of the electronic devices. During the experiments, it is expected that the electronic devices will be exposed to about 105 neutrons/cm2/s according to FLUKA simulations. This paper investigates the reliability of a System On Module (SOM) under neutron radiation. The tests were performed using thermal, epithermal, and fast neutrons produced by the Instituto de Pesquisas Energéticas e Nucleares 4.5 MW Nuclear Research Reactor. The results show that the National Instruments SOM is robust to neutron radiation for the proposed applications in the NUMEN project.

中文翻译：

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中子辐射对模块电子系统的影响

NUMEN（无中微子双β衰变的核矩阵元素）项目最近被提出，目的是研究当前和未来0νββ衰变研究探索的所有同位素对双电荷交换反应的核响应。NUMEN 实验中预期的辐射水平严重限制了电子设备的平均寿命。在实验过程中，根据 FLUKA 模拟，预计电子设备将暴露于大约 105 个中子/cm2/s。本文研究了系统模块 (SOM) 在中子辐射下的可靠性。这些测试是使用由 Instituto de Pesquisas Energéticas e 核能研究反应堆 4.5 MW 核研究反应堆产生的热中子、超热中子和快中子进行的。