Response to uniaxial stress has become a major probe of electronic materials. Tunable uniaxial stress may be applied using piezoelectric actuators, and so far two methods have been developed to couple samples to actuators. In one, actuators apply force along the length of a free, beam-like sample, allowing very large strains to be achieved. In the other, samples are affixed directly to piezoelectric actuators, allowing the study of mechanically delicate materials. Here, we describe an approach that merges the two: thin samples are affixed to a substrate, which is then pressurized uniaxially using piezoelectric actuators. Using this approach, we demonstrate the application of large elastic strains to mechanically delicate samples: the van der Waals-bonded material FeSe and a sample of CeAuSb2 that was shaped with a focused ion beam.

中文翻译：

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用于将大的可调应变应用于机械精密样品的刚性平台

对单轴应力的响应已成为电子材料的主要探索。可以使用压电致动器施加可调谐的单轴应力，到目前为止，已经开发了两种方法来将样品耦合到致动器。一方面，致动器沿自由梁状样品的长度施加力，从而实现非常大的应变。另一种是将样品直接固定在压电致动器上，从而可以研究机械精密材料。在这里，我们描述了一种将两者结合的方法：将薄样品固定在基板上，然后使用压电致动器对其进行单轴加压。使用这种方法，我们展示了将大弹性应变应用于机械精密样品：范德华键合材料 FeSe 和用聚焦离子束成形的 CeAuSb2 样品。