Polyether ether ketone (PEEK) is widely used as an electrical insulation material in aerospace field due to its excellent thermal and electrical properties. The changes in micro structure of the PEEK irradiated by 1 MeV electrons are studied by in-situ analysis of synchronous small-angle X-ray scattering (SAXS) and wide-angle X-ray diffraction (WAXD) during tensile deformation at room temperature. The tensile strength and the elongation at break of the irradiated PEEK decrease obviously, which is compared with the pristine one. The differential scanning calorimetry (DSC) analysis shows that the pristine PEEK begins to melt at 334.8 °C, the melting peak T_m appears at 339.7 °C and a deeper exothermic crystallization peak T_c appears at 297.8 °C during the cooling process. The crystallization peak temperature decreases with the increase of the irradiation fluences. The pristine PEEK has a significant scattering peak along the meridian direction of the SAXS pattern, which indicates that the crystal lamellae of the material exhibits a certain orientation, and the position of the scattering peak changes little after irradiation. The intensity of SAXS decreases with the increasing of stretching strains, and the descent rate increases with the increasing of the irradiation fluences. According to the WAXD analysis, the width at half height of the diffraction peak increases with the increasing of the stretching strain, and the peak tends to disappear during tensile deformation. The diffraction peak disappearance rate increases with the increasing of the irradiation fluences.

聚醚醚酮（PEEK）由于其优异的热和电性能而被广泛用作航空航天领域的电绝缘材料。通过在室温下拉伸变形过程中同步小角X射线散射（SAXS）和广角X射线衍射（WAXD）的原位分析研究了1 MeV电子辐照的PEEK的微观结构变化。与原始PEEK相比，辐照PEEK的拉伸强度和断裂伸长率明显降低。差示扫描量热法（DSC）分析表明，原始PEEK在334.8°C时开始熔化，熔化峰T _m在339.7°C_处出现，并且放热结晶峰T _c更深在冷却过程中出现于297.8°C。结晶峰温度随辐照量的增加而降低。原始的PEEK沿SAXS图案的子午线方向有一个显着的散射峰，这表明该材料的晶体薄片呈现出一定的取向，并且散射峰的位置在照射后几乎没有变化。SAXS的强度随拉伸应变的增加而降低，下降速率随辐照通量的增加而增加。根据WAXD分析，衍射峰的半高宽度随着拉伸应变的增加而增加，并且该峰在拉伸变形期间趋于消失。衍射峰消失率随辐照通量的增加而增加。