The cooled pressing method is used for preparing (ZnSe)_1−xTe_x chalcogenide glasses. The thermal evaporation technique is utilized for depositing the thin films. Topological calculations reveal the obvious effect of doping Te content on the average coordination number Z, parameter determines the deviation from stoichiometry r, glass transition temperature T_g, number of lone-pair electrons L and heat of atomization H_s. Swanepoel's approach is used to estimate the refractive index and the average thickness of the films with high accuracy. The addition of tellurium as an impurity found to has a great influence on the optical parameters such as refractive index, energy band gap E_g, Urbach energy E_u, refractive index n, single oscillator energy E_o, dispersion energy E_d, free-electron concentration N, and plasma frequency, ${\omega }_p$.

采用冷压法制备（ZnSe）_1-x Te _x硫族化物玻璃。利用热蒸发技术来沉积薄膜。拓扑计算表明，掺杂Te的含量对平均配位数Z有明显的影响，参数确定与化学计量比r的偏差，玻璃化转变温度T _g，孤对电子数L和雾化热_s。Swanepoel的方法用于高精度地估计薄膜的折射率和平均厚度。碲作为杂质的添加对光学参数（如折射率，能带隙E _g，Urbach能量E _u）有很大影响，折射率n，单振荡器能量E _o，色散能量E _d，自由电子浓度N和等离子体频率，${\omega }_p$。