Alternate testing techniques have been progressively adopted as a promising solution due to their effectiveness against classical specification-based test methods. This work presents a built-in test system, which adaptively generates an indirect digital signature characterising the circuit under test, which is later used to diagnose the actual performances relying on a statistical dictionary-based diagnosis method. The system is composed of an integrated digital signature generator and a digital control and acquisition subsystem. The signature generator is based on a converter architecture, in which the analogue range can be adapted to the magnitude of the indirect measure using the well known information of the fault-free circuit. The digital subsystem controls the proposed architecture and stores the digital codes sent by the integrated digital signature generator. The digital signature generator has been designed and fabricated in an industrial 65 nm complementary metal–oxide–semiconductor technology from STMicroelectronics, whereas the digital control and acquisition subsystem have been prototyped in a field-programmable gate array. The fabricated system has been used to test a biquad filter affected by parametric variations. Successful experimental results are reported showing the capabilities of the proposed adaptive test system to diagnose circuit performances with discrepancies as low as 1% of the actual real value.

中文翻译：

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基于预选稳态响应措施的模拟电路的间接和自适应测试

由于替代测试技术相对于基于经典规范的测试方法有效，因此已逐渐被采用为有希望的解决方案。这项工作提出了一个内置的测试系统，该系统自适应地生成表征被测电路的间接数字签名，该数字签名随后用于基于基于统计字典的诊断方法来诊断实际性能。该系统由一个集成的数字签名生成器和一个数字控制与获取子系统组成。签名生成器基于转换器架构，在该架构中，可以使用无故障电路的众所周知的信息将模拟范围调整为间接度量的大小。数字子系统控制所提出的体系结构，并存储由集成数字签名生成器发送的数字代码。数字签名发生器是采用意法半导体的工业65 nm互补金属-氧化物-半导体技术设计和制造的，而数字控制和采集子系统已在现场可编程门阵列中进行了原型设计。所制造的系统已用于测试受参数变化影响的双二阶滤波器。据报道，成功的实验结果表明，所提出的自适应测试系统具有诊断电路性能的能力，其差异仅为实际实际值的1％。数字签名生成器是采用意法半导体的工业65 nm互补金属-氧化物-半导体技术设计和制造的，而数字控制和采集子系统已在现场可编程门阵列中进行了原型设计。所制造的系统已用于测试受参数变化影响的双二阶滤波器。据报道，成功的实验结果表明所提出的自适应测试系统具有诊断电路性能的能力，其差异可低至实际实际值的1％。数字签名发生器是采用意法半导体的工业65 nm互补金属-氧化物-半导体技术设计和制造的，而数字控制和采集子系统已在现场可编程门阵列中进行了原型设计。所制造的系统已用于测试受参数变化影响的双二阶滤波器。据报道，成功的实验结果表明，所提出的自适应测试系统具有诊断电路性能的能力，其差异仅为实际实际值的1％。