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Ammonia gas sensing response of gamma-irradiated CdTe thin films
Materials Science in Semiconductor Processing ( IF 4.1 ) Pub Date : 2021-01-01 , DOI: 10.1016/j.mssp.2020.105394
Saloni Goyal , R.P. Chauhan

Abstract In this work, cadmium telluride (CdTe) thin films of thickness 250 nm are deposited on the glass substrate using the thermal vacuum evaporation (TVE) method. The as-deposited CdTe thin films are then exposed to three different doses of gamma rays (50, 100 and 150 kGy) from 60Co source at Inter University Accelerator Centre, New Delhi, India. The structural, morphological, electrical and gas sensing properties of as-prepared and gamma-irradiated thin films are investigated using grazing incidence X-ray diffraction (G-XRD), Field emission scanning electron microscopy (FESEM) and two-probes set up connected with current-voltage (I–V) source meter, respectively. The assessment of adsorption and desorption rate of pristine and gamma-irradiated films is studied using Brunauer –Emmett-Teller (BET) analysis. After irradiation, the XRD pattern indicates the polycrystalline nature of thin films along with the retention of cubic structure with a minor decrease in the crystallite size at the highest gamma dose. From FESEM, relevant changes in the surface morphology of thermally deposited CdTe thin films have been observed after irradiation. Moreover, the films after irradiation were found to be highly conductive up to the dose of 100 kGy as depicted from electrical studies. The gamma irradiated films are further proposed for gas sensing applications. For the highest concentration of ammonia (36.02 ppm), the maximum sensitivity of the as-deposited film is found to be (14.59%) which is higher than the sensitivity at a maximum gamma dose of 150 kGy (10.28%) for the same concentration of gas which shows that process of gamma irradiation deteriorates the sensing performance of CdTe thin films.

中文翻译:

伽马辐照 CdTe 薄膜的氨气敏响应

摘要 在这项工作中,使用热真空蒸发 (TVE) 方法在玻璃基板上沉积了 250 nm 厚的碲化镉 (CdTe) 薄膜。然后将沉积的 CdTe 薄膜暴露于来自印度新德里大学间加速器中心的 60Co 源的三种不同剂量的伽马射线(50、100 和 150 kGy)。使用掠入射 X 射线衍射 (G-XRD)、场发射扫描电子显微镜 (FESEM) 和连接的两个探针研究了所制备和伽马射线照射薄膜的结构、形态、电学和气敏特性。分别使用电流-电压 (I-V) 源表。使用 Brunauer-Emmett-Teller (BET) 分析对原始和伽马辐照薄膜的吸附和解吸速率进行评估。辐照后,XRD 图案表明薄膜的多晶性质以及立方结构的保留,在最高伽马剂量下微晶尺寸略有减小。从 FESEM 中,可以观察到热沉积 CdTe 薄膜在辐照后表面形貌的相关变化。此外,如电学研究所示,发现辐照后的薄膜在高达 100 kGy 的剂量下具有高导电性。伽马辐照薄膜进一步被提议用于气体传感应用。对于最高浓度的氨 (36.02 ppm),发现沉积膜的最大灵敏度为 (14.59%),高于最大伽马剂量 150 kGy (10.
更新日期:2021-01-01
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