Measurements of mass attenuation coefficients and X‐ray absorption fine structure (XAFS) of zinc selenide (ZnSe) are reported to accuracies typically better than 0.13%. The high accuracy of the results presented here is due to our successful implementation of the X‐ray extended range technique, a relatively new methodology, which can be set up on most synchrotron X‐ray beamlines. 561 attenuation coefficients were recorded in the energy range 6.8–15 keV with measurements concentrated at the zinc and selenium pre‐edge, near‐edge and fine‐structure absorption edge regions. This accuracy yielded detailed nanostructural analysis of room‐temperature ZnSe with full uncertainty propagation. Bond lengths, accurate to 0.003 Å to 0.009 Å, or 0.1% to 0.3%, are plausible and physical. Small variation from a crystalline structure suggests local dynamic motion beyond that of a standard crystal lattice, noting that XAFS is sensitive to dynamic correlated motion. The results obtained in this work are the most accurate to date with comparisons with theoretically determined values of the attenuation showing discrepancies from literature theory of up to 4%, motivating further investigation into the origin of such discrepancies.

中文翻译：

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使用X射线扩展范围技术高精度测定光电截面，X射线吸收精细结构和硒化锌的纳米结构分析。

据报道，硒化锌（ZnSe）的质量衰减系数和X射线吸收精细结构（XAFS）的测量精度通常优于0.13％。此处显示的结果的高精度归功于我们成功实施了X射线扩展范围技术，这是一种相对较新的方法，可以在大多数同步加速器X射线束线上建立。在6.8-15 keV的能量范围内记录了561个衰减系数，测量结果集中在锌和硒的前边缘，近边缘和精细结构的吸收边缘区域。这种精确度可以对室温ZnSe进行详细的纳米结构分析，并具有完全的不确定性传播。精确至0.003Å至0.009Å或0.1％至0.3％的键长是合理且物理的。晶体结构的微小变化表明局部动态运动超出了标准晶格的运动，并指出XAFS对动态相关运动敏感。与理论上确定的衰减值相比，这项工作中获得的结果是迄今为止最准确的，显示出与文献理论相差不超过4％的差异，从而促使人们进一步研究此类差异的起源。