当前位置: X-MOL 学术J. Sol-Gel Sci. Technol. › 论文详情
Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)
Spectroelectrochemistry in the investigation of sol–gel electrochromic V 2 O 5 films
Journal of Sol-Gel Science and Technology ( IF 2.5 ) Pub Date : 2020-06-17 , DOI: 10.1007/s10971-020-05337-5
Angelja K. Surca , Goran Dražić , Mohor Mihelčič

Spectroelectrochemistry can offer important insights into the performance of materials that change properties during electrochemical treatment. The benefits of spectroelectrochemical measurements are shown through the example of an electrochromic sol–gel vanadium(V) oxide (V2O5) film. In situ UV-visible absorbance spectroelectrochemistry is indispensable to reveal the optical modulation, which reached about 28% during the first coloration in the unsafe potential range, but then diminished to around 12% during the following cycles. Ex situ IR and Raman spectroscopy were used to probe the structural modifications that occur during the intercalation of small ions into the orthorhombic structure of the crystalline V2O5 film. In particular, infrared reflection–absorption (IR RA) and IR absorption spectroelectrochemistry confirmed the red shift of the vanadyl band and the disappearance of the bridging oxygen band due to the puckering of layers of VO5 square pyramids following intercalation. In addition, Raman spectra reveal the broad and low-intensity bands of the V2O5 film after it has been coloured in the unsafe potential range. Electron energy-loss spectroscopy (EELS) revealed the presence of vanadium in oxidation states V4+, V4+/V5+, and V5+ on different positions on the bleached film.



中文翻译:

光谱法研究溶胶-凝胶电致变色V 2 O 5膜

光谱电化学可以为在电化学处理过程中改变性能的材料的性能提供重要的见识。通过电致变色溶胶-凝胶氧化钒(V)2(V 2 O 5)膜的实例显示了光谱电化学测量的好处。原位紫外可见吸收光谱化学是揭示光学调制必不可少的,它在不安全电位范围内的第一次着色过程中达到了约28%,但在随后的循环中降低了约12%。非原位红外和拉曼光谱用于探测在将小离子嵌入V 2 O 5晶体的斜方晶结构中发生的结构修饰电影。尤其是,红外反射吸收(IR RA)和红外吸收光谱电化学证实了钒基带的红移和桥接氧带的消失,这是由于插层后VO 5方锥的褶皱所致。另外,拉曼光谱揭示了在不安全电位范围内着色后的V 2 O 5膜的宽谱带和低强度谱带。电子能量损失谱(EELS)揭示了在漂白膜上不同位置上,氧化态为V 4+,V 4+ / V 5+和V 5+的钒的存在。

更新日期:2020-08-16
down
wechat
bug