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Beam damage of single semiconductor nanowires during X-ray nanobeam diffraction experiments.
Journal of Synchrotron Radiation ( IF 2.5 ) Pub Date : 2020-08-12 , DOI: 10.1107/s1600577520009789 Ali Al Hassan 1 , Jonas Lähnemann 2 , Arman Davtyan 1 , Mahmoud Al-Humaidi 1 , Jesús Herranz 2 , Danial Bahrami 1 , Taseer Anjum 1 , Florian Bertram 3 , Arka Bikash Dey 3 , Lutz Geelhaar 2 , Ullrich Pietsch 1
中文翻译：
X 射线纳米束衍射实验中单根半导体纳米线的束损伤。
更新日期：2020-09-03
Journal of Synchrotron Radiation ( IF 2.5 ) Pub Date : 2020-08-12 , DOI: 10.1107/s1600577520009789 Ali Al Hassan 1 , Jonas Lähnemann 2 , Arman Davtyan 1 , Mahmoud Al-Humaidi 1 , Jesús Herranz 2 , Danial Bahrami 1 , Taseer Anjum 1 , Florian Bertram 3 , Arka Bikash Dey 3 , Lutz Geelhaar 2 , Ullrich Pietsch 1
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中文翻译：
X 射线纳米束衍射实验中单根半导体纳米线的束损伤。
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