This article presents measurements of the piezoelectric modulus d 11 of a single crystal of lanthanum gallium silicate (LGS, La3Ga5SiO14). The piezoelectric modulus was measured by X-ray diffraction at angles close to backscattering. Experiments in such schemes are very sensitive to relative changes in the lattice constant in crystals caused by external influences (constant or alternating electric field, mechanical load, temperature change etc.). The development opportunity of the technique is shown, its applicability is evaluated and results of measurement of the LGS single-crystal piezo modulus by the method of diffraction of synchrotron radiation at angles near π are discussed.

中文翻译：

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用接近 π 角的同步辐射衍射法测量单晶压电模量

本文介绍了单晶硅酸镧镓 (LGS, La3Ga5SiO14) 的压电模量 d 11 的测量结果。压电模量是通过 X 射线衍射在接近背向散射的角度测量的。这种方案中的实验对由外部影响（恒定或交变电场、机械负载、温度变化等）引起的晶体晶格常数的相对变化非常敏感。展示了该技术的发展机遇，对其适用性进行了评价，并讨论了利用接近π角的同步辐射衍射法测量LGS单晶压电模量的结果。