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Metrisability of projective surfaces and pseudo-holomorphic curves
Mathematische Zeitschrift ( IF 0.8 ) Pub Date : 2020-08-08 , DOI: 10.1007/s00209-020-02586-6
Thomas Mettler

We show that the metrisability of an oriented projective surface is equivalent to the existence of pseudo-holomorphic curves. A projective structure $\mathfrak{p}$ and a volume form $\sigma$ on an oriented surface $M$ equip the total space of a certain disk bundle $Z\to M$ with a pair $(J_{\mathfrak{p}},\mathfrak{J}_{\mathfrak{p},\sigma})$ of almost complex structures. A conformal structure on $M$ corresponds to a section of $Z\to M$ and $\mathfrak{p}$ is metrisable by the metric $g$ if and only if $[g] : M \to Z$ is a pseudo-holomorphic curve with respect to $J_{\mathfrak{p}}$ and $\mathfrak{J}_{\mathfrak{p},dA_g}$.

中文翻译:

射影曲面和伪全纯曲线的度量

我们证明了定向射影曲面的度量性等价于伪全纯曲线的存在。一个投影结构 $\mathfrak{p}$ 和一个有向表面 $M$ 上的体积形式 $\sigma$ 用一对 $(J_{\mathfrak{ p}},\mathfrak{J}_{\mathfrak{p},\sigma})$ 几乎复杂的结构。$M$ 上的保形结构对应于 $Z\to M$ 的一部分,并且 $\mathfrak{p}$ 可以通过度量 $g$ 度量当且仅当 $[g] : M \to Z$ 是一个关于 $J_{\mathfrak{p}}$ 和 $\mathfrak{J}_{\mathfrak{p},dA_g}$ 的伪全纯曲线。
更新日期:2020-08-08
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