We investigate the uncertainty of large-signal measurements of a microwave transistor due to variation in the load conditions at the fundamental frequency. In particular, we evaluate uncertainties in the complex frequency-domain traveling voltage waves. In our analysis, uncertainty sources typical for large-signal measurements are considered. Then, we discuss how the resultant uncertainty in the waves is dependent on a varying load reflection coefficient. For this investigation, we consider the total uncertainty of the waves and their magnitude and phase. We also show that these errors unavoidably affect the uncertainty of performance quantities, such as output power.

中文翻译：

---

可变负载条件下大信号测量的不确定度

由于基频负载条件的变化，我们研究了微波晶体管大信号测量的不确定性。特别是，我们评估了复杂频域行电压波中的不确定性。在我们的分析中，考虑了大信号测量的典型不确定性来源。然后，我们讨论波中合成的不确定性如何取决于变化的负载反射系数。在本次调查中，我们考虑了波及其幅度和相位的总不确定性。我们还表明，这些误差不可避免地会影响性能数量的不确定性，例如输出功率。