The addition of RF interferometers to vector network analyzer (VNA) test benches has allowed for realization of low-noise high-frequency measurements of extreme impedance devices. However, when employing correction techniques such as the short-open-load method, the RF response of the interferometer hardware introduces measurement inaccuracies due to unwanted load-dependent inconsistencies. This letter presents a novel VNA calibration method that enables both low-noise and accurate small-signal characterization of highly mismatched devices. The proposed solution is experimentally validated in the 10–18-GHz band, confirming a 23-fold improvement in measurement resolution with absolute accuracy across the entire $\Gamma $ range of the VNA. The accuracy of the new calibration process is verified via comparison with traceable reference standards supported by state-of-the-art uncertainties.

中文翻译：

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基于有源干涉仪的 VNA 校准新方法

向矢量网络分析仪 (VNA) 测试台添加 RF 干涉仪，可以实现极端阻抗设备的低噪声高频测量。然而，当采用诸如短路开路负载方法之类的校正技术时，干涉仪硬件的 RF 响应会由于与负载相关的不一致性而导致测量不准确。这封信提出了一种新颖的 VNA 校准方法，该方法可以对高度失配的设备进行低噪声和准确的小信号表征。所提出的解决方案在 10–18 GHz 频段进行了实验验证，证实了在 VNA 的整个 $\Gamma $ 范围内具有绝对精度的测量分辨率提高了 23 倍。