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Development of an Application Specific Integrated Circuit for Signal Detection in Experimental Studies of Fast Processes
Optoelectronics, Instrumentation and Data Processing Pub Date : 2020-01-01 , DOI: 10.3103/s8756699020010112
V. M. Aulchenko , V. V. Zhulanov , L. I. Shekhtman

This paper presents a new integrated circuit designed for signal readout in a silicon microstrip detector in experimental observations of fast processes at a synchrotron radiation beam. The first variants of this circuit were used in a prototype detector based on a microstrip silicon sensor and were tested at an intense synchrotron radiation beam at the VEPP-4M storage ring in the Institute of Nuclear Physics, Siberian Branch, Russian Academy of Sciences. The results of the first measurements showed that the main objectives of this development were achieved: the time resolution and frame rate satisfy the initial specifications and the maximum detected signal in a linear mode of operation provides a significant increase in the detected photon flux compared to the previous version of the detector based on gas technology. The main problem detected during testing of the prototype is the relatively high noise level, which will be reduced in the next version of the integrated circuit by optimizing some circuit solutions.

中文翻译:

在快速过程的实验研究中开发用于信号检测的专用集成电路

本文介绍了一种新的集成电路,该集成电路设计用于硅微带探测器中的信号读出,用于同步辐射束快速过程的实验观察。该电路的第一个变体用于基于微带硅传感器的原型探测器,并在俄罗斯科学院西伯利亚分院核物理研究所的 VEPP-4M 存储环上的强同步辐射束下进行测试。第一次测量的结果表明,实现了这一发展的主要目标:时间分辨率和帧速率满足初始规格,线性操作模式下的最大检测信号与常规模式相比显着增加了检测到的光子通量。以前版本的基于气体技术的检测器。
更新日期:2020-01-01
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