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Transfer phenomenon of charge carriers in crystals of Ca(Al0.1Ga0.9)2S4:Eu2+
Modern Physics Letters B ( IF 1.9 ) Pub Date : 2020-08-05 , DOI: 10.1142/s0217984920503443
G. S. Hadjieva 1 , K. O. Taghiyev 2 , E. G. Asadov 1 , F. A. Kazimova 1 , T. Sh. Ibragimova 1 , O. B. Taghiyev 1, 3
Affiliation  

Research study of volt-amperage properties (VAP) of [Formula: see text] crystals determined the mechanism of current flow though the studied samples and this mechanism is based on barrier Schottky emission and emission of Franklin–Paul. The dielectric constant of the material, height of the potential barrier on metal–semiconductor border, concentration of the traps and the effective mass of electrons are calculated.

中文翻译:

Ca(Al0.1Ga0.9)2S4:Eu2+晶体中电荷载流子的转移现象

[公式:见正文] 晶体的伏安特性 (VAP) 的研究确定了电流流经所研究样品的机制,该机制基于势垒肖特基发射和富兰克林-保罗发射。计算了材料的介电常数、金属-半导体边界势垒的高度、陷阱的浓度和电子的有效质量。
更新日期:2020-08-05
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