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Facile Synthesis of Highly Conductive Vanadium-Doped NiO Film for Transparent Conductive Oxide
Applied Sciences ( IF 2.838 ) Pub Date : 2020-08-05 , DOI: 10.3390/app10165415
Ashique Kotta , Hyung Kee Seo

Metal-oxide-based electrodes play a crucial role in various transparent conductive oxide (TCO) applications. Among the p-type materials, nickel oxide is a promising electrically conductive material due to its good stability, large bandgap, and deep valence band. Here, we display pristine and 3 at.%V-doped NiO synthesized by the solvothermal decomposition method. The properties of both the pristine and 3 at.%V:NiO nanoparticles were characterized by field emission scanning electron microscopy (FESEM), transmission electron microscopy (TEM), X-ray diffractometry (XRD), Raman spectroscopy, ultraviolet–visible spectroscopy (UV–vis), and X-ray photoelectron spectroscopy (XPS). The film properties were characterized by atomic force microscopy (AFM) and a source meter. Our results suggest that incorporation of vanadium into the NiO lattice significantly improves both electrical conductivity and hole extraction. Also, 3 at.%V:NiO exhibits a lower crystalline size when compared to pristine nickel oxide, which maintains the reduction of surface roughness. These results indicate that vanadium is an excellent dopant for NiO.

中文翻译:

透明导电氧化物的高导电钒掺杂NiO薄膜的简便合成

基于金属氧化物的电极在各种透明导电氧化物(TCO)应用中起着至关重要的作用。在p型材料中,氧化镍由于其良好的稳定性,大的带隙和较深的价带而成为有前途的导电材料。在这里,我们展示了通过溶剂热分解法合成的原始和3 at。%V掺杂的NiO。通过场发射扫描电子显微镜(FESEM),透射电子显微镜(TEM),X射线衍射仪(XRD),拉曼光谱,紫外可见光谱()表征原始和3 at。%V:NiO纳米颗粒的特性紫外可见)和X射线光电子能谱(XPS)。通过原子力显微镜(AFM)和源计表征膜的性质。我们的结果表明,将钒掺入NiO晶格可显着改善电导率和空穴提取。同样,与原始氧化镍相比,3 at。%V:NiO的晶体尺寸较小,从而保持了表面粗糙度的降低。这些结果表明钒是NiO的优良掺杂剂。
更新日期:2020-08-05
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