Abstract Single element/compound reference materials (RM) were generated from high purity salts or nanoparticles on 25 and 47 mm PTFE filters for use in calibration and quality checks of X-ray fluorescence (XRF) analysis. The aerosols were deposited using a custom-made aerosol generation system equipped with common ambient air particulate matter samplers. The mass loadings on the RM were determined based on gravimetric measurements and the stoichiometry of the deposits, and then confirmed by energy dispersive XRF, inductively coupled plasma mass spectrometry, and/or ion chromatography. Selected RM were demonstrated to have homogeneous deposits and be stable both short- and long-term when handled and stored properly. Overall, RM on PTFE filters with minimum loadings ~0.5 μg/cm2 and uncertainty ≤10% for Na, Al, Si, S, Cl, K, Ca, Ti, V, Cr, Fe, Cu, Zn, Ce, and Pb have been generated. These gravimetrically certified RM are invaluable in calibrations of the XRF analyzers, as they are the only ones available on PTFE membranes with mass loadings typical of those collected from ambient air. In addition, these RM can be utilized to monitor instrumental performance over time and together with multi-elemental reference materials can help examine common artifacts in spectral analysis.

中文翻译：

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在 PTFE 过滤器上开发用于气溶胶样品分析的单一化合物参考材料

摘要 单元素/化合物参考材料 (RM) 由高纯度盐或纳米粒子在 25 和 47 毫米 PTFE 过滤器上生成，用于 X 射线荧光 (XRF) 分析的校准和质量检查。使用配备常见环境空气颗粒物采样器的定制气溶胶生成系统沉积气溶胶。RM 上的质量负载基于重量测量和沉积物的化学计量确定，然后通过能量色散 XRF、电感耦合等离子体质谱和/或离子色谱法确认。选定的 RM 被证明具有均匀的沉积物，并且在妥善处理和储存时短期和长期都是稳定的。总体而言，对于 Na、Al、Si、S、Cl、K、Ca、Ti、V、Cr、Fe、Cu 和不确定度≤10% 的 PTFE 过滤器的 RM，已生成 Zn、Ce 和 Pb。这些经重量分析认证的 RM 在 XRF 分析仪的校准中是非常宝贵的，因为它们是唯一可用于 PTFE 膜的产品，其质量负载通常是从环境空气中收集的。此外，这些 RM 可用于随时间监测仪器性能，并与多元素参考材料一起帮助检查光谱分析中的常见伪影。