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Combining high throughput and high quality for cryo-electron microscopy data collection.
Acta Crystallographica Section D ( IF 2.2 ) Pub Date : 2020-07-27 , DOI: 10.1107/s2059798320008347
Felix Weis 1 , Wim J H Hagen 1
Affiliation  



中文翻译:

结合高通量和高质量的冷冻电子显微镜数据收集。

更新日期:2020-08-03
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