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Titanium disulfide as Schottky/ohmic contact for monolayer molybdenum disulfide
npj 2D Materials and Applications ( IF 9.7 ) Pub Date : 2020-07-31 , DOI: 10.1038/s41699-020-00161-5
Junsen Gao , Manisha Gupta

2D semiconductors like Molybdenum disulfide (MoS2) still have issues in forming good metal electrode (Schottky and Ohmic) especially for mono layer (ML) to few layers thick due to strain and metallization issues. Here, we explore a 2D semi-metal, titanium disulfide (TiS2), for making different types of contacts with ML MoS2 using density functional theory (DFT). It is observed that ML TiS2 induces ML MoS2 to become p-type with a doping density of 3.85 × 1017 cm−3 which becomes larger with thicker TiS2. Thus, TiS2 can thus be utilized as a variable contact material ohmic if the MoS2 is p-type and as Schottky if the MoS2 is n-type with a Schottky barrier height ranging from 0.3 to 1.35 eV. One of the important results from the study is that compared to a traditional metal–MoS2 in a TiS2–MoS2 contact the bandgap is preserved where in contrast, a traditional metal contact metalizes the monolayer MoS2 and fill its bandgap with states. Hence, a clear path forward to make pristine contacts is to use 2D semi-metals in conjunction with 2D semiconductors.



中文翻译:

二硫化钛作为肖特基/欧姆接触的单层二硫化钼

诸如二硫化钼(MoS 2)的2D半导体在形成良好的金属电极(肖特基和欧姆)方面仍然存在问题,尤其是由于应变和金属化问题,对于单层(ML)到几层厚的电极。在这里,我们探索二维半金属二硫化钛(TiS 2),使用密度泛函理论(DFT)与ML MoS 2进行不同类型的接触。观察到,ML TiS 2引起ML MoS 2变成p型,掺杂密度为3.85×10 17  cm -3,而TiS 2越厚,掺杂密度越大。因此,如果MoS 2可以将TiS 2用作可变接触材料欧姆如果MoS 2为n型且肖特基势垒高度范围为0.3到1.35 eV,则p为p型,肖特基为Schottky 。该研究的重要结果之一是,与TiS 2 -MoS 2接触中的传统金属MoS 2相比,能带隙得以保留,相比之下,传统金属接触使单层MoS 2金属化并用态填充其带隙。因此,实现原始接触的明确途径是将2D半金属与2D半导体结合使用。

更新日期:2020-07-31
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