In the past decade, the investigation of the electronic structures of topological quantum materials (TQMs) has not only provided important insights for fundamental science research but has also laid a solid foundation for designing and fabricating novel functional devices. Angle-resolved photoemission spectroscopy (ARPES), with its capability of directly visualizing the electronic structures of crystals in momentum space, has played a critical role in discovering and understanding many TQMs. On the other hand, the ARPES technique has also been greatly improved—including the much enhanced energy and momentum resolutions, and the importation of new detection degrees of freedom—which in turn further advanced the research on TQMs. In this review, we first give a brief introduction to the principle of ARPES, then focus on its application in different TQMs; we also review some recent advances in ARPES techniques with their representative applications in TQMs and finally present a brief perspective.

在过去的十年中，对拓扑量子材料（TQM）的电子结构的研究不仅为基础科学研究提供了重要的见识，而且还为设计和制造新型功能器件奠定了坚实的基础。角分辨光发射光谱法（ARPES）具有直接可视化动量空间中晶体电子结构的能力，在发现和理解许多TQM中起着关键作用。另一方面，ARPES技术也得到了极大改进，包括大大提高了能量和动量分辨率，并引入了新的检测自由度，从而进一步推进了TQM的研究。在这篇评论中，我们首先简要介绍ARPES的原理，然后专注于其在不同TQM中的应用；我们还回顾了ARPES技术的最新进展及其在TQM中的代表性应用，最后给出了一个简短的观点。