For the development of wearable and stretchable devices, insights into the mechanical properties and structural deformation of functional conjugated polymers are required. In particular, polythiophene has received much attention as a typical hole transfer material in electronic devices. However, the widely accepted polythiophenes are brittle because of the rigid chemical structure of thiophene rings. We have reported on the synthesis and flexible properties of polythiophene with disiloxane groups in side chains, and it was revealed that the polythiophene exhibited greater than 200% elongation at break at room temperature. In this study, we investigated the deformation process of polythiophene through in situ measurements under stretching using X-ray diffraction of synchrotron radiation and polarized infrared spectroscopy. In the X-ray diffraction measurements, orientation of the crystallites occurred after yielding, while the relative intensities of the polarized infrared absorption bands gradually increased during stretching. As seen from these results, during the initial deformation, the polythiophene chains in the amorphous region were aligned, and then, the whole bulk of the polythiophene, including crystallites and amorphous regions, were oriented after yielding. We succeeded in tracing the structural deformation of polythiophene during stretching. For the development of wearable and stretchable devices, stretchable and flexible semiconductive materials are desired. To understand the mechanical behavior of structural deformation of polythiophene with disiloxane groups, we performed in situ measurements under stretching using X-ray diffraction of synchrotron radiation and polarized infrared spectroscopy. The behaviors of amorphous region was oriented during the initial deformation, while the orientation of crystallites began after permanent set.

中文翻译：

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具有二硅氧烷部分的弹性聚噻吩在拉伸下的结构变形

为了开发可穿戴和可拉伸设备，需要深入了解功能共轭聚合物的机械性能和结构变形。特别是聚噻吩作为电子器件中典型的空穴传输材料而备受关注。然而，由于噻吩环的刚性化学结构，广泛接受的聚噻吩很脆。我们已经报道了侧链上带有二硅氧烷基团的聚噻吩的合成和柔性特性，结果表明该聚噻吩在室温下的断裂伸长率超过 200%。在这项研究中，我们通过使用同步辐射的 X 射线衍射和偏振红外光谱在拉伸下进行原位测量来研究聚噻吩的变形过程。在 X 射线衍射测量中，晶粒在屈服后发生取向，而偏振红外吸收带的相对强度在拉伸过程中逐渐增加。从这些结果可以看出，在初始变形过程中，非晶区的聚噻吩链是对齐的，然后，整个聚噻吩，包括微晶和非晶区，在屈服后取向。我们成功地追踪了聚噻吩在拉伸过程中的结构变形。为了开发可穿戴和可拉伸设备，需要可拉伸和柔性的半导体材料。为了了解具有二硅氧烷基团的聚噻吩结构变形的力学行为，我们使用同步辐射的 X 射线衍射和偏振红外光谱在拉伸下进行了原位测量。非晶区的行为在初始变形期间取向，而微晶的取向在永久变形后开始。