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Single Event Upset rates in the CBC in CMS
Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment ( IF 1.4 ) Pub Date : 2020-07-22 , DOI: 10.1016/j.nima.2020.164416
G. Hall , J. Borg , K. Uchida , L. Jones , M. Prydderch

The CMS Binary Chip (CBC) is a front-end ASIC to be used by the CMS tracker following its upgrade for High Luminosity LHC operation. It will instrument special silicon microstrip detectors to identify high transverse momentum particles in real time so tracking data can be used in the L1 trigger. The CBC should be robust against Single Event Upsets (SEUs). SEU rates have been measured in a series of tests in a 62 MeV proton beam. Each version of the chip has increased the digital circuitry, and hence the SEU susceptibility, and has also been subject to design improvements which affect SEU tolerance. The relevant design features are explained and SEU measurements reported. The expected SEU rates at the HL-LHC are estimated.



中文翻译:

CMS中CBC中的单个事件失败率

CMS二进制芯片(CBC)是在CMS跟踪器升级为高亮度LHC操作后将使用的前端ASIC。它将装备特殊的硅微带检测器,以实时识别高横向动量粒子,因此可以在L1触发器中使用跟踪数据。CBC应该能够抵抗单一事件干扰(SEU)。SEU率是在62 MeV质子束中进行的一系列测试中测得的。每种版本的芯片都增加了数字电路,因此增加了SEU的敏感性,并且还经历了会影响SEU公差的设计改进。解释了相关的设计功能并报告了SEU测量值。估计了HL-LHC的预期SEU费率。

更新日期:2020-07-22
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