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A holistic approach to interface stabilization for efficient perovskite solar modules with over 2,000-hour operational stability
Nature Energy ( IF 56.7 ) Pub Date : 2020-07-20 , DOI: 10.1038/s41560-020-0653-2
Zonghao Liu , Longbin Qiu , Luis K. Ono , Sisi He , Zhanhao Hu , Maowei Jiang , Guoqing Tong , Zhifang Wu , Yan Jiang , Dae-Yong Son , Yangyang Dang , Said Kazaoui , Yabing Qi

The upscaling of perovskite solar cells to module scale and long-term stability have been recognized as the most important challenges for the commercialization of this emerging photovoltaic technology. In a perovskite solar module, each interface within the device contributes to the efficiency and stability of the module. Here, we employed a holistic interface stabilization strategy by modifying all the relevant layers and interfaces, namely the perovskite layer, charge transporting layers and device encapsulation, to improve the efficiency and stability of perovskite solar modules. The treatments were selected for their compatibility with low-temperature scalable processing and the module scribing steps. Our unencapsulated perovskite solar modules achieved a reverse-scan efficiency of 16.6% for a designated area of 22.4 cm2. The encapsulated perovskite solar modules, which show efficiencies similar to the unencapsulated one, retained approximately 86% of the initial performance after continuous operation for 2,000 h under AM1.5G light illumination, which translates into a T90 lifetime (the time over which the device efficiency reduces to 90% of its initial value) of 1,570 h and an estimated T80 lifetime (the time over which the device efficiency reduces to 80% of its initial value) of 2,680 h.



中文翻译:

全面的界面稳定方法可实现高效钙钛矿太阳能电池组件,并具有超过2000小时的运行稳定性

钙钛矿太阳能电池到模块规模的升级和长期稳定性已被公认为这种新兴光伏技术商业化的最重要挑战。在钙钛矿型太阳能模块中,设备内的每个接口都有助于提高模块的效率和稳定性。在这里,我们通过修改所有相关的层和界面(即钙钛矿层,电荷传输层和器件封装)采用整体界面稳定策略,以提高钙钛矿太阳能电池组件的效率和稳定性。选择这些处理是因为它们与低温可扩展处理和模块划线步骤兼容。我们的未封装钙钛矿太阳能电池组件在22.4 cm的指定区域内实现了16.6%的反向扫描效率2。封装后的钙钛矿太阳能电池组件的效率与未封装的钙钛矿太阳能电池组件相似,在AM1.5G光照下连续运行2,000小时后,仍保留了约86%的初始性能,这转化为T 90寿命(该设备的使用寿命)效率降低到1,570小时的初始值的90%,估计的T 80寿命(设备效率降低到初始值的80%的时间)为2,680小时。

更新日期:2020-07-20
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