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Retention of Deuterium in the Surface Layers of Tungsten Preliminarily Irradiated with Helium Ions
Bulletin of the Russian Academy of Sciences: Physics Pub Date : 2020-07-16 , DOI: 10.3103/s1062873820060040
Z. R. Harutyunyan , Yu. M. Gasparyan , V. S. Efimov , S. A. Ryabtsev , A. A. Pisarev

Abstract

The retention of deuterium in tungsten preliminarily irradiated with helium ions is investigated by means of thermal desorption spectroscopy (TDS). Preliminary irradiation is performed with a He+ ion beam having an energy of 3 keV and fluence ranging in the interval 1019–1021 He m−2, in order to produce a defect structure typical of different degrees of damage. The specimens are then irradiated with \({\text{D}}_{3}^{ + }\) ions having an energy of 2 keV and a weak fluence of 1019 D m−2, with subsequent TDS analysis to characterize the interaction between deuterium and helium-induced defects. It is shown that an increase in the deuterium retention is observed as soon as irradiation with the minimal fluence of helium ions, but it falls to the background level at fluences above 5 × 1021 He m−2 .


中文翻译:

预先用氦离子辐照的钨表面层中的氘保留

摘要

通过热解吸光谱法(TDS)研究了氦离子初步辐照的钨中氘的保留。初步辐照使用的He +离子束的能量为3 keV,能量密度在10 19 –10 21 He m -2的范围内,以产生通常具有不同损伤程度的缺陷结构。然后用能量为2 keV和弱通量为10 19 D m -2的\({\ text {D}} _ {3} ^ {+} \)离子辐照样品,随后进行TDS分析,以表征氘与氦诱导的缺陷之间的相互作用。结果表明,在氦离子通量最小的情况下,辐照后氘的保留量增加,但当通量大于5×10 21 He m -2时,氘的保留量降至背景水平。
更新日期:2020-07-16
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