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Growth of extremely flat Bi(110) films on a Si(111)√3 × √3-B substrate
Applied Physics Express ( IF 2.3 ) Pub Date : 2020-07-09 , DOI: 10.35848/1882-0786/aba0df
Kentaro Nagase 1 , Ryota Ushioda 1 , Kan Nakatsuji 2 , Tetsuroh Shirasawa 3 , Hiroyuki Hirayama 1
Affiliation  

Extremely flat, two-bilayer-high Bi(110) film was grown on a Si(111)√3 × √3-B substrate by two-step growth. Round amorphous islands nucleated during the initial deposition of Bi atoms at 90 K. The islands became larger and transformed into atomically flat, two-bilayer-high Bi(110) islands at a critical size (40 nm 2 ) in subsequent annealing. The Bi(110) islands extended laterally, and the substrate was finally covered by an extremely flat, two-bilayer-high Bi(110) film at room temperature. Surface X-ray diffraction revealed that the Bi film had a black phosphorous structure.

中文翻译:

在Si(111)√3×√3-B衬底上生长非常平坦的Bi(110)膜

通过两步生长,在Si(111)√3×√3-B衬底上生长极其平坦的两层高Bi(110)薄膜。在90 K下Bi原子的初始沉积过程中,成核的圆形非晶岛成核。这些岛变大,并在随后的退火过程中转变成原子平坦的,双层高Bi(110)岛,其临界尺寸为(40 nm 2)。Bi(110)岛横向延伸,最后在室温下用一块非常平坦的两层高Bi(110)薄膜覆盖了基板。表面X射线衍射表明Bi膜具有黑色磷结构。
更新日期:2020-07-10
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