Automated electron temperature fitting of Langmuir probe I – V trace in plasmas with multiple Maxwellian EEDFs,Plasma Science and Technology

当前位置： X-MOL 学术 › Plasm. Sci. tech. › 论文详情

Our official English website, www.x-mol.net, welcomes your feedback! (Note: you will need to create a separate account there.)

Automated electron temperature fitting of Langmuir probe I – V trace in plasmas with multiple Maxwellian EEDFs
Plasma Science and Technology ( IF 1.7 ) Pub Date : 2020-07-06 , DOI: 10.1088/2058-6272/ab7f3d
Chi-Shung YIP ₁ , Wei ZHANG ₁ , Guosheng XU ₁ , Noah HERSHKOWITZ ₂

Affiliation

An algorithm for automated fitting of the effective electron temperature from a planar Langmuir probe I – V trace taken in a plasma with multiple Maxwellian electron populations is developed through MATLAB coding. The code automatically finds a fitting range suitable for analyzing the temperatures of each of the electron populations. The algorithm is used to analyze I – V traces from both the Institute of Plasma Physics Chinese Academy of Sciences’s Diagnostic Test Source device and a similar multi-dipole chamber at the University of Wisconsin–Madison. I – V traces reconstructed from the parameters fitted by the algorithm not only agree with the measured I – V trace but also reveal physical properties consistent with those found in previous studies. Cylindrical probe traces are also analyzed with the algorithm and it is shown that the major source of error in such attempts is the disruption of the inflection point due to both decre...

更新日期：2020-07-07

点击分享查看原文

点击收藏

阅读更多本刊最新论文

全部期刊列表>>