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Design of an energy analyzer for highly charged Ions HCI beams
Journal of Instrumentation ( IF 1.3 ) Pub Date : 2020-07-03 , DOI: 10.1088/1748-0221/15/07/t07001
R. Boussaid

The measurements of the energy spread and the average beam energy for highly charged ion (HCI) beams, such as those delivered from EBIS charge breeder ion source and ECR ion source, demand the development of an energy analyzer of highest measurement efficiency. A new prototype of a compact analyzer called retarding field energy analyzer RFEA capable to handle all kinds of HCI beams at RISP project is being designed. The RFEA's efficiency measurement has been evaluated via numerical simulations. The involvements of the beam emittance and, mainly, the space charge effect to degrade the RFEA's efficiency have been simulated. The simulations showed that the developed RFEA, with its improved optics system and for optimum voltages on the focusing cylinder, may lead to high efficiency energy resolutions not exceeding 0.57 eV for beam energy going up to 20 keV . Acceptable errors on the measured energy spread not exceeding 30 % are, likewise, achieved despite the presence of degradations stemming from the previous degrading effects. The measurement of the average energy showed large shifts of some hundred eV from the theoretical average beam energy due to the overlapping of the ensemble of beamlets forming the HCI beam. The 3D design of this analyzer and its components will be also presented. The material of these components and their positioning to avoid electrical breakdowns will be also discussed.

中文翻译:

高电荷离子 HCI 束能量分析仪的设计

高带电离子 (HCI) 束的能量散布和平均束能量的测量,例如从 EBIS 电荷增殖离子源和 ECR 离子源提供的那些,需要开发具有最高测量效率的能量分析仪。正在设计一种称为延迟场能量分析仪 RFEA 的紧凑型分析仪的新原型,能够在 RISP 项目中处理各种 HCI 光束。RFEA 的效率测量已通过数值模拟进行评估。已经模拟了光束发射的参与,主要是空间电荷效应降低 RFEA 的效率。模拟表明,开发的 RFEA 及其改进的光学系统和聚焦柱上的最佳电压,可能会导致不超过 0 的高效能量分辨率。高达 20 keV 的束能量为 57 eV。不超过 30% 的测量能量分布的可接受误差同样实现,尽管存在源自先前退化效应的退化。由于形成 HCI 光束的小束集合的重叠,平均能量的测量表明与理论平均光束能量有数百 eV 的大偏移。还将介绍该分析仪及其组件的 3D 设计。还将讨论这些组件的材料及其避免电气故障的位置。由于形成 HCI 光束的小束集合的重叠,平均能量的测量表明与理论平均光束能量有数百 eV 的大偏移。还将介绍该分析仪及其组件的 3D 设计。还将讨论这些组件的材料及其避免电气故障的位置。由于形成 HCI 光束的小束集合的重叠,平均能量的测量表明与理论平均光束能量有数百 eV 的大偏移。还将介绍该分析仪及其组件的 3D 设计。还将讨论这些组件的材料及其避免电气故障的位置。
更新日期:2020-07-03
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