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FLUXON-INDUCED LOSSES IN NIOBIUM THIN-FILM CAVITIES REVISITED
IEEE Transactions on Applied Superconductivity ( IF 1.8 ) Pub Date : 2020-12-01 , DOI: 10.1109/tasc.2020.2998941
Wolfgang Weingarten

Long standing data from niobium thin film accelerating cavities will be revisited and analysed by a modified London model of RF superconductivity. Firstly, the applicability of this model is explored using data of the BCS surface resistance and its dependence on the RF magnetic field, temperature and mean free path. Secondly, the RF losses from trapped magnetic flux are analysed with regard to their dependence on these same parameters.

中文翻译:

重新审视铌薄膜腔中磁通子引起的损耗

来自铌薄膜加速腔的长期数据将通过改进的伦敦射频超导模型重新审视和分析。首先,使用 BCS 表面电阻的数据及其对 RF 磁场、温度和平均自由程的依赖性来探索该模型的适用性。其次,分析了捕获磁通量的 RF 损失对这些相同参数的依赖性。
更新日期:2020-12-01
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