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Rapid tolerance‐aware design of miniaturized microwave passives by means of confined‐domain surrogates
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields ( IF 1.6 ) Pub Date : 2020-07-01 , DOI: 10.1002/jnm.2779
Anna Pietrenko‐Dabrowska 1
Affiliation  

The effects of uncertainties, primarily manufacturing tolerances but also incomplete information about operating conditions or material parameters, can be detrimental to the performance of microwave components. Quantification of such effects is essential to ensure a meaningful evaluation of the structure, in particular, its reliability under imperfect fabrication procedures. The improvement of the circuit robustness can be achieved by reducing sensitivity to geometry/material parameter deviations, which requires optimization of suitably chosen statistical performance metrics such as the yield. The prerequisite for the latter is statistical analysis. In the case of compact circuits, it is executed through full‐wave electromagnetic (EM) analysis. The fundamental difficulty, that is, the high CPU cost, can be alleviated by the employment of fast surrogate models, which is the method of choice for the majority of contemporary approaches. Despite its advantages, a practical challenge of surrogate‐assisted design is the initial computational overhead related to metamodel construction. As a workaround, this work proposes the employment of a recently introduced concept of constrained modelling, where the surrogate domain is confined only to contain the essential subsets of the parameter space. In the context of yield optimization, the domain needs to correspond to directions featuring maximum variability of the circuit responses (particularly the parts thereof that affect the yield value in the most significant way) with respect to its geometry parameters. The small volume of the domain spanned by such directions permits setting up an accurate model using a fraction of training data samples required by conventional methods. The proposed technique is demonstrated using a miniaturized microstrip rat‐race coupler with its yield optimized at the cost of just a few dozen of EM simulations of the circuit. EM‐based Monte Carlo simulations corroborate the reliability of the approach.

中文翻译:

借助受限域替代物快速识别小型微波无源器件的公差

不确定性的影响(主要是制造公差)以及有关操作条件或材料参数的不完整信息可能会损害微波组件的性能。量化这些影响对于确保对结构进行有意义的评估至关重要,尤其是在不完善的制造程序下其可靠性。电路的鲁棒性的改善可以通过减少几何/材料参数偏差的敏感性,这需要的适当选择的统计性能指标,如产率优化来实现。后者的前提是统计分析。对于紧凑型电路,它是通过全波电磁(EM)分析来执行的。基本的困难,即高CPU成本,可以通过使用快速替代模型来缓解这种情况,这是大多数现代方法的选择方法。尽管有其优点,替代辅助设计的一个实际挑战是与元模型构建相关的初始计算开销。作为一种变通方法,这项工作建议采用最近引入的约束建模概念,其中替代域仅被限制为包含参数空间的基本子集。在成品率优化的情况下,该域需要对应于电路响应相对于其几何参数具有最大可变性的方向(尤其是以最重要的方式影响成品率的部分)。由这些方向跨越的小范围域允许使用常规方法所需的一部分训练数据样本来建立准确的模型。使用微型微带鼠种族耦合器演示了所建议的技术,并以几十个电路的EM仿真为代价优化了其产量。基于EM的Monte Carlo仿真证实了该方法的可靠性。
更新日期:2020-07-01
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