Abstract An increasing trend toward integration of polymers in microelectronics and organic electronics has recently boosted research focusing in metal-polymer interfaces. These two materials differ vastly, with the former forming dense, crystalline, cohesive structures and the latter forming open structures bound together by weak van der Waals forces. As a result, there is dire need to assess their surface features (e.g., roughness) and correlate them with corresponding growth parameters, as metal-polymer interfaces are mainly determined by the preparation process. Here, we report a laboratory-based grazing-incidence small-angle x-ray scattering (GISAXS) study on distinct gold-polymer interfaces fabricated with different growth mechanisms, utilizing in-plane and oblique sputter geometries. GISAXS provided an improved analytic scheme for the buried surface in free-standing 2D gold-polymer nanosheets (with 19% porosity) revealing their fractal structure (Porod slope: −1.71). Two quantitative approaches (Height-Height Correlation and Power Spectral Density functions) were used to describe rough surfaces characterized by Atomic Force Microscopy (AFM) in consort with GISAXS data; different correlation length dependencies on growth time were revealed for gold rough surfaces grown on bare and polymerized Si. The results are considered pertinent to interfacial nanoscience and engineering, enabling statistical data collection from large surface areas, in a fast and nondestructive manner.

中文翻译：

---

GISAXS 探测多功能金聚合物纳米界面

摘要 聚合物在微电子和有机电子中的集成趋势最近促进了对金属-聚合物界面的研究。这两种材料差别很大，前者形成致密的、结晶的、有凝聚力的结构，而后者形成由弱范德华力结合在一起的开放结构。因此，迫切需要评估它们的表面特征（例如粗糙度）并将它们与相应的生长参数相关联，因为金属-聚合物界面主要由制备过程决定。在这里，我们报告了一项基于实验室的掠入射小角 X 射线散射 (GISAXS) 研究，该研究利用平面内和倾斜溅射几何结构，对不同生长机制制造的不同金-聚合物界面进行了研究。GISAXS 为独立式二维金聚合物纳米片（具有 19% 的孔隙率）中的埋藏表面提供了一种改进的分析方案，揭示了它们的分形结构（波罗德斜率：-1.71）。两种定量方法（高度-高度相关和功率谱密度函数）用于描述由原子力显微镜 (AFM) 结合 GISAXS 数据表征的粗糙表面；对于在裸硅和聚合硅上生长的金粗糙表面，揭示了对生长时间的不同相关长度依赖性。结果被认为与界面纳米科学和工程相关，能够以快速和无损的方式从大表面积收集统计数据。两种定量方法（高度-高度相关和功率谱密度函数）用于描述由原子力显微镜 (AFM) 结合 GISAXS 数据表征的粗糙表面；对于在裸硅和聚合硅上生长的金粗糙表面，揭示了对生长时间的不同相关长度依赖性。结果被认为与界面纳米科学和工程相关，能够以快速和无损的方式从大表面积收集统计数据。两种定量方法（高度-高度相关和功率谱密度函数）用于描述由原子力显微镜 (AFM) 结合 GISAXS 数据表征的粗糙表面；对于在裸硅和聚合硅上生长的金粗糙表面，揭示了对生长时间的不同相关长度依赖性。结果被认为与界面纳米科学和工程相关，能够以快速和无损的方式从大表面积收集统计数据。