We present a new contact resonance force microscopy (CRFM) imaging technique, isomorphic contact resonance (iso-CR), that acquires data at a constant contact resonance (CR) frequency, and hence constant tip-sample contact stiffness across the scan area. Constant CR frequency is obtained by performing force versus distance measurements to vary the applied force at each pixel (i.e. force-volume mapping mode). The CR frequency increases with increasing applied force; thus, a carefully selected target frequency will be reached for most pixels at some point in the force versus distance curve. In the iso-CR mode, the cantilever maintains an invariant vibrational shape and a constant environmental damping, thus simplifying interpretation of amplitude and quality factor contrast compared to conventional CRFM. Iso-CR imaging of a piezoelectric AlN thin film sample is demonstrated. Iso-CRFM images were obtained by mechanically driving the base of the cantilever, and iso-CR piezoresponse f...

中文翻译：

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AlN薄膜的同构接触共振力显微镜和压电响应力显微镜：一种新的接触共振技术的演示

我们提出了一种新的接触共振力显微镜（CRFM）成像技术，即同构接触共振（iso-CR），该技术以恒定的接触共振（CR）频率获取数据，从而在整个扫描区域中获得恒定的尖端样品接触刚度。通过执行力对距离测量以改变每个像素处的施加力（即，力-体积映射模式），可以获得恒定的CR频率。CR频率随着施加力的增加而增加；因此，在力对距离曲线的某个点上，大多数像素将达到精心选择的目标频率。在iso-CR模式下，悬臂保持不变的振动形状和恒定的环境阻尼，因此与传统的CRFM相比，简化了幅度和品质因数对比的解释。对压电AlN薄膜样品的iso-CR成像进行了说明。通过机械地驱动悬臂的底部，获得iso-CRFM图像，并通过iso-CR压电响应来获得...