The intrinsic limit on ballisticity of ultra-scaled transistors is investigated. A novel probing technique is presented, which locally resolves the loss of incident fluxes. This projection reveals the scalable and unscalable components of reflection. The poor ballisticity is explained by non-equilibrium distribution around the potential barrier, which triggers a substantial unscalable reflections.

中文翻译：

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不可缩放反射的弹道饱和度

研究了超大规模晶体管弹道的内在限制。提出了一种新颖的探测技术，它可以局部解决入射通量的损失。该投影揭示了反射的可伸缩和不可伸缩组件。差的弹道性可以通过势垒周围的非平衡分布来解释，这会引发大量不可缩放的反射。