The microwave dielectric properties of (Mg_1-xCo_x)₂SnO₄ were investigated by X-ray diffraction (XRD) patterns, Rietveld refinement, Raman spectroscopy, and microstructural observation. As x increased from 0 to 0.05, both the lattice constant and the unit cell volume increased, indicating that the Co²⁺ ions effectively dissolved among the Mg²⁺ ions. However, when x exceeded 0.05, the Co²⁺ ions were not effectively dissolved. The bond length in the oxygen octahedron increased with x. In the Raman spectroscopy, the Raman peak in the A_1g vibration mode shifted to a lower frequency as x increased. The (Mg_0.95Co_0.05)₂SnO₄ ceramic had the lowest FWHM of the peak in the A_1g Raman mode. (Mg_0.95Co_0.05)₂SnO₄ ceramic that was sintered at 1550 °C for 4 h had a dielectric constant (ε_r) of 8.3, a quality factor (Q × f) of 120,200 GHz (at 17.6 GHz), and a temperature coefficient of resonant frequency (τ_f) of − 63 ppm/°C.

通过X射线衍射（XRD）图谱，Rietveld精细化，拉曼光谱和显微组织观察研究了（Mg _1-x Co _x）₂ SnO ₄的微波介电性能。当x从0增加到0.05时，晶格常数和晶胞体积均增加，表明Co ²⁺离子有效地溶解在Mg ²⁺离子之中。然而，当x超过0.05时，Co ²⁺离子不能有效地溶解。氧八面体中的键长随x增加。在拉曼光谱中，A _1g中的拉曼峰x增大时，振动模式移至较低频率。（Mg _0.95 Co _0.05）₂ SnO ₄陶瓷在A _1g拉曼模式下具有最低的峰FWHM 。（镁_0.95钴_0.05）₂的SnO ₄这是在1550烧结陶瓷℃下4小时有介电常数（ε _{- [R}的8.3），质量因子（Q  ×  ˚F 120200千兆赫）（在17.6千兆赫），以及一个谐振频率（的温度系数τ _˚F 63ppm的/℃ -的）。