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Ion Transport Mechanisms in the Oxide Film Formed on 316L Stainless Steel Surfaces Studied by ToF-SIMS with 18 O 2 Isotopic Tracer
Journal of The Electrochemical Society ( IF 3.9 ) Pub Date : 2020-06-28 , DOI: 10.1149/1945-7111/ab9c87
Luntao Wang , Antoine Seyeux , Philippe Marcus

The composition and structure of the native and passive oxide films formed on 316 L stainless steel have been studied in situ by ToF-SIMS. High temperature re-oxidation experiments in isotopic 18 O 2 gas have also been done to assess the ion transport mechanisms in the native and passive oxide films. Duplex oxides with an inner Cr rich layer and an outer layer rich in Fe and Mo oxide have been observed on native and passive oxide films. Exposure of the oxide films to isotopic 18 O 2 tracer at 300 °C reveals that the outward cationic diffusion governs the inner oxide growth. The outer Mo-rich layer prevents the continued transport of Cr to the outermost surface. The passive film, due to its composition and structure, exhibits a markedly lower oxidation rate compared to native oxide films.

中文翻译:

用18 O 2同位素示踪的ToF-SIMS研究316L不锈钢表面氧化膜中的离子迁移机理

通过ToF-SIMS原位研究了在316 L不锈钢上形成的本征和被动氧化膜的组成和结构。还已经在同位素18 O 2气体中进行了高温再氧化实验,以评估自然氧化膜和被动氧化膜中的离子传输机制。在天然和钝化氧化膜上已观察到具有内富铬层和外富铁和钼氧化物的双相氧化物。氧化膜在300°C下暴露于同位素18 O 2示踪剂表明,向外的阳离子扩散控制着内部氧化物的生长。外部富钼层阻止了Cr继续输送到最外层表面。与天然氧化膜相比,无源膜由于其组成和结构而表现出明显更低的氧化速率。
更新日期:2020-06-29
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