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Light and Elevated Temperature Induced Degradation (LeTID) in a Utility-Scale Photovoltaic System
IEEE Journal of Photovoltaics ( IF 3 ) Pub Date : 2020-07-01 , DOI: 10.1109/jphotov.2020.2989168
Michael G. Deceglie , Timothy J Silverman , Steve W. Johnston , James A. Rand , Mason J. Reed , Robert Flottemesch , Ingrid L. Repins

We present a detailed case study of degradation in monocrystalline silicon photovoltaic modules operating in a utility-scale power plant over the course of approximately three years. We present the results of degradation analysis on arrays within the site, and find that five of the six arrays degraded faster than the best performing array, even though the arrays consist of modules of the same manufacturer and model. We also describe the results of extensive laboratory characterization of modules returned from the field, including module- and cell-level current–voltage characterization, luminescence imaging, and accelerated testing. The laboratory test results and the field performance are consistent with light and elevated temperature induced degradation (LeTID). Notably, we observe differences in back contact technology between affected and unaffected modules. This article also demonstrates a method to identify possible LeTID degradation in the field and confirm the result with laboratory testing of a small number of modules.

中文翻译:

公用事业规模光伏系统中的光和高温引起的退化 (LeTID)

我们提供了一个详细的案例研究,在大约三年的时间里,在公用事业规模的发电厂中运行的单晶硅光伏模块退化。我们展示了对站点内阵列的退化分析结果,发现六个阵列中的五个比性能最佳的阵列退化得更快,即使这些阵列由相同制造商和型号的模块组成。我们还描述了对从现场返回的模块进行广泛实验室表征的结果,包括模块级和电池级电流-电压表征、发光成像和加速测试。实验室测试结果和现场性能与光和高温诱导退化 (LeTID) 一致。尤其,我们观察到受影响和未受影响模块之间的背接触技术差异。本文还演示了一种在现场识别可能的 LeTID 退化的方法,并通过对少量模块的实验室测试来确认结果。
更新日期:2020-07-01
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