Abstract SnO2 thin films were grown on glass substrate using a spin-coating technique. The films grown in different layers and subjected to pressure-assisted heat treatment (PAHT) were characterized by Raman spectroscopy and Photoacoustic measurements. Raman spectroscopy showed the SnO2 presence in the grown thin film and in the substrate. In addition, PAHT can change the adsorbed oxygen and the oxygen vacancies in the film. These changes strongly influence the band gap energy of samples, which were investigated by photoacoustic spectroscopy and showed a blueshift in samples after PATH treatment. A depth profile analyze with excitation on the substrate indicated a slow attenuation of the photoacoustic signal relative to tin dioxide up to 120 μm, which represents SnO2 presence up to 40 μm deep in the glass substrate. The average effective thermal diffusivity, determined by two-beam phase-lag photoacoustic method was α=(0.017 ± 0.001) cm2/s, according the literature for pure tin dioxide.

中文翻译：

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通过旋涂技术沉积的 SnO2 薄膜的拉曼光谱和光声光谱

摘要 使用旋涂技术在玻璃基板上生长 SnO2 薄膜。在不同层中生长并经受压力辅助热处理 (PAHT) 的薄膜通过拉曼光谱和光声测量进行表征。拉曼光谱显示在生长的薄膜和衬底中存在 SnO2。此外，PAHT 可以改变薄膜中吸附的氧和氧空位。这些变化强烈影响样品的带隙能量，通过光声光谱研究并显示样品在 PATH 处理后发生蓝移。在基板上用激发进行的深度剖面分析表明，相对于二氧化锡，光声信号缓慢衰减至 120 μm，这表示玻璃基板中 SnO2 的存在深度达 40 μm。