Nowadays, Self-Test strategies for testing embedded processors are increasingly diffused, especially for safety critical systems. Test programs can be effectively used for this purpose. This paper describes a set of systematic self-test techniques for in-order dual-issue embedded processors. The paper shows how to produce test programs suitable for the detection of faults in five classes of sub-modules: duplicated computational modules; multi-port register file; duplicated pipeline registers and feed-forward paths; pipeline interlocking logic; and pre-fetch buffer. While some techniques extend single-issue test programs, new techniques are also shown; results are illustrated for a couple of 32-bit in-order dual-issue processors included in automotive Systems-on-Chip manufactured by STMicroelectronics.

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双核嵌入式处理器的基于软件的自检技术

如今，用于测试嵌入式处理器的自检策略越来越广泛，尤其是对于安全关键系统。测试程序可以有效地用于此目的。本文介绍了一套用于有序双发嵌入式处理器的系统自检技术。本文展示了如何生成适用于检测五类子模块中的故障的测试程序：重复计算模块；多端口寄存器文件；重复的流水线寄存器和前馈路径；管道互锁逻辑；和预取缓冲区。虽然一些技术扩展了单一问题的测试程序，但也展示了新技术；图为 STMicroelectronics 制造的汽车片上系统中包含的几个 32 位有序双发处理器的结果。