Electron probe microanalyser measurements of trace elements with high accuracy are challenging. Accurate Al measurements in olivine are required to calibrate SIMS implant reference materials for measurement of Al in the solar wind. We adopt a combined EPMA/SIMS approach that is useful for producing SIMS reference materials as well as for EPMA at the ~ 100 µg g⁻¹ level. Even for mounts not polished with alumina photoelectron spectroscopy shows high levels of Al surface contamination. In order to minimise electron beam current density, a rastered 50 × 100 µm electron beam was adequate and minimised sensitivity to small Al‐rich contaminants. Reproducible analyses of eleven SIMS‐cleaned spots on San Carlos olivine agreed at 69.3 ± 1.0 µg g⁻¹. The known Al mass fraction was used to calibrate an Al implant into San Carlos. Accurate measurements of Al were made for olivines in the pallasites: Imilac, Eagle Station and Springwater. Our focus was on Al in olivine, but our technique could be refined to give accurate electron probe measurements for other contamination‐sensitive trace elements. For solar wind, it is projected that the Al/Mg abundance ratio can be determined to 6%, a factor of 2 more precise than the solar spectroscopic ratio.

中文翻译：

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橄榄石中铝的电子微探针/SIMS 测定：在太阳风、陨石和微量元素测量中的应用

微量元素的高精度电子探针微量分析仪测量具有挑战性。需要在橄榄石中进行准确的铝测量，以校准 SIMS 植入参考材料，以测量太阳风中的铝。我们采用组合 EPMA/SIMS 方法，该方法可用于生产 SIMS 参考材料以及 ~ 100 µg g ^-1水平的EPMA 。即使对于未使用氧化铝光电子能谱抛光的安装座，也显示出高水平的铝表面污染。为了最小化电子束电流密度，光栅 50 × 100 µm 电子束就足够了，并且最小化了对小的富铝污染物的敏感性。对圣卡洛斯橄榄石上 11 个 SIMS 清洁点的可重现分析结果一致为 69.3 ± 1.0 µg g ^-1. 已知的铝质量分数用于将铝植入物校准到圣卡洛斯。对以下橄榄石中的橄榄石进行了准确测量：Imilac、Eagle Station 和 Springwater。我们的重点是橄榄石中的铝，但我们的技术可以改进，以便为其他污染敏感的痕量元素提供准确的电子探针测量。对于太阳风，预计铝/镁丰度比可以确定为 6%，比太阳光谱比精确 2 倍。