Motivated by an accelerated degradation test (ADT) on the power gain of microwave power amplifiers, in this article we propose a model-ranking approach for the estimation of some important reliability characteristics. Different degradation models and statistical lifetime distributions are applied to model the data obtained from the ADT. We study the effect of model misspecification in estimating the reliability characteristics when the behavior of the degradation process and the underlying degradation-data-generating mechanism are unknown. We then propose a model-ranking approach with weighted estimation procedures when multiple candidate models are under consideration. Through a Monte Carlo simulation study, we show that the proposed approach is robust and insensitive to model misspecification. Finally, the ADT data from the motivating example are used to illustrate the proposed methodologies.

中文翻译：

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基于加速退化试验数据的模型排序估计方法

受微波功率放大器功率增益加速退化测试 (ADT) 的启发，在本文中，我们提出了一种模型排序方法，用于估计一些重要的可靠性特性。应用不同的退化模型和统计寿命分布来对从 ADT 获得的数据进行建模。当退化过程的行为和潜在的退化数据生成机制未知时，我们研究了模型错误指定在估计可靠性特性方面的影响。然后，当考虑多个候选模型时，我们提出了一种带有加权估计程序的模型排序方法。通过蒙特卡罗模拟研究，我们表明所提出的方法是稳健的并且对模型错误指定不敏感。最后，