The effect of surface roughness on hydrogen-induced blister behavior in pure iron was explored using optical microscopy and microcomputerized tomography. Hydrogen was introduced into the samples by electrochemical precharging methods with various hydrogen charging times. It is found that grinded surface exhibits higher roughness and compressive residual stress compared to those of polished surface. With increasing hydrogen charging time, hydrogen-induced blister height, blister width and blister area fraction increase, regardless of the grinded surface and polished surface. Further, hydrogen blister height and width of grinded surface are comparative to polished surface under the same hydrogen charging time. However, the blister area fraction and the number of blister on polished surface are considerably higher than the grinded surface, indicating that polished surface is more susceptible to the formation of blisters than that of grinded surface, both of surface and interior of the samples. This is dominantly rationalized in terms of the suppression effect of hydrogen invasion in grinded surfaces due to their higher residual compressive stress and higher dislocation density.

中文翻译：

---

表面粗糙度对纯铁中氢诱导的水泡行为的影响

使用光学显微镜和计算机断层扫描技术研究了表面粗糙度对纯铁中氢诱导的起泡行为的影响。通过电化学预充电方法在不同的氢气充电时间下将氢气引入样品中。发现与抛光表面相比，磨削表面表现出更高的粗糙度和压缩残余应力。随着加氢时间的增加，无论研磨表面和抛光表面如何，氢诱导的水泡高度，水泡宽度和水泡面积分数都会增加。此外，在相同的氢气充入时间下，氢气泡的高度和研磨表面的宽度与抛光表面相比。但是，抛光表面上的气泡面积分数和气泡数量要比研磨表面高得多，表明样品的表面和内部，抛光的表面比研磨的表面更容易形成气泡。由于其较高的残余压缩应力和较高的位错密度，这在抑制研磨表面中氢入侵的抑制作用方面是合理的。