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Tests Concerning Certain Types of Faults at the Scheme Inputs
Moscow University Computational Mathematics and Cybernetics Pub Date : 2019-08-31 , DOI: 10.3103/s0278641919020055
V. K. Kurbatskaia

Estimates are obtained for the Shannon function of the length of a diagnostic test with respect to cyclic shifts of scheme inputs, and for the Shannon function of fault detection and length of a diagnostic test with respect to a single stuck-at fault and a cyclic shift of scheme inputs.

中文翻译:

在方案输入端进行有关某些类型故障的测试

针对方案输入的循环移位获得诊断测试时间的香农函数估计值,针对单个卡住的故障和循环移位获得故障检测的香农函数的估计值以及诊断测试的长度。方案输入。
更新日期:2019-08-31
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