Abstract

A method for the measurement of the complex permittivity of insulators using a microwave coaxial photonic crystal is proposed and implemented. The method is based on a solution to an inverse problem using minimization of the difference of experimental and calculated frequency dependences of the transmission and reflection coefficients at the defect-mode frequency in the band gap of a photonic microwave crystal containing a structure with the parameters that must be determined. An unambiguous solution to the inverse problem can be obtained using a defect mode in the band gap at the frequency of which a maximum of the standing wave is obtained in the region of the structure under study.

中文翻译：

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微波同轴布拉格结构在绝缘子参数测量中的应用

摘要

提出并实现了一种利用微波同轴光子晶体测量绝缘子复介电常数的方法。该方法基于对逆问题的解决方案，该解决方案是通过在光子微波晶体的带隙中以缺陷模式频率将透射系数和反射系数的实验和计算频率相关性的差异最小化来实现的，该光子微波晶体的带隙结构具有以下参数：必须确定。可以使用带隙中的缺陷模式获得反问题的明确解决方案，该缺陷模式的频率在研究的结构区域中获得最大的驻波。