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Stuck-At Fault Mitigation of Emerging Technologies Based Switching Lattices
Journal of Electronic Testing ( IF 0.9 ) Pub Date : 2020-06-01 , DOI: 10.1007/s10836-020-05885-2
Lorena Anghel , Anna Bernasconi , Valentina Ciriani , Luca Frontini , Gabriella Trucco , Ioana Vatajelu

Switching lattices are two-dimensional arrays composed of two or four-terminals switches organized as a crossbar array. The idea of using regular two-dimensional arrays of switches for Boolean function implementation was proposed by Akers in 1972. Recently, with the advent of a variety of emerging nanoscale technologies, lattices have found a renewed interest. Emerging technologies allow more complex function integration, thanks to their smaller sizes and advanta geous properties such as zero leakage current, capability to retain data when in power-off state, and almost unlimit edendurance, to name just a few appealing features. Also, implementation of new computing paradigms combining memory and logic becomes possible. However, emerging technologies show a non-negligible defect ratio and higher sensitivity to process and environment variations. The reliability challenges in adopting these technologies need to be investigated. In this paper, we analyze the resilience of switching lattices to stuck-at-fault model (SAF). We first identify the critical switches through an elaborated sensitivity methodology and extensive analysis of the lattice. Next, we propose several techniques to improve lattice resilience in the face of these types of faults, that can be implemented after lattice logic optimization steps.

中文翻译:

基于新兴技术的开关晶格的卡住故障缓解

交换点阵是由两个或四个端子的开关组成的二维阵列,这些开关组织为纵横阵列。Akers 在 1972 年提出了使用规则二维开关阵列实现布尔函数的想法。最近,随着各种新兴纳米级技术的出现,格子重新引起了人们的兴趣。新兴技术允许更复杂的功能集成,这要归功于它们更小的尺寸和诸如零漏电流、断电状态下保留数据的能力以及几乎无限的耐用性等优势特性,仅举几个吸引人的特性。此外,结合内存和逻辑的新计算范式的实现成为可能。然而,新兴技术显示出不可忽视的缺陷率和对工艺和环境变化的更高敏感性。需要调查采用这些技术的可靠性挑战。在本文中,我们分析了将晶格切换到固定故障模型(SAF)的弹性。我们首先通过详细的灵敏度方法和对晶格的广泛分析来确定关键开关。接下来,我们提出了几种技术来提高面对这些类型的故障时的晶格弹性,这些技术可以在晶格逻辑优化步骤之后实施。
更新日期:2020-06-01
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