Accurate near-field measurements for either deterministic or stochastic electromagnetic fields characterization require a relevant process that removes the influence of the probes, transmission lines, and measurement circuits. The main part of the experimental work presented here is related to a calibration procedure of a test setup consisting of a microstrip test structure and a scanning loop probe. The calibration characteristic, obtained by comparing measured and simulated results, is then used to convert the measured voltage into the magnetic field across and along the microstrip line at the specific height above it. By performing the measurements and simulations of the same test structure with the loop probe in the presence of an additional scanning probe, the influence of the additional probe to the measured output is thoroughly investigated and relevant corrections are given. These corrections can be important when two-point correlation measurement is required, especially in scanning points when two probes are mutually close.

中文翻译：

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校准用于近场测量的环形探头

确定性或随机电磁场表征的准确近场测量需要一个相关的过程来消除探头、传输线和测量电路的影响。这里介绍的实验工作的主要部分与由微带测试结构和扫描环路探针组成的测试装置的校准程序有关。通过比较测量结果和模拟结果获得的校准特性，然后用于将测量电压转换为在其上方特定高度处穿过和沿着微带线的磁场。通过在存在附加扫描探头的情况下使用环形探头执行相同测试结构的测量和模拟，彻底调查了附加探头对测量输出的影响，并给出了相关修正。当需要两点相关测量时，这些校正可能很重要，尤其是在两个探头相互靠近时的扫描点中。