Broad and low‐intensity Raman peaks are usually expected from nanocrystalline thin semiconductor films. The inherently weak Raman scattering phenomenon can be further deteriorated by unwanted background signals preventing the successful Raman analysis of an analyte. In this study, the resonant and surface‐enhanced Raman scattering techniques were combined to detect CuO and Cu₂O phases in the partially oxidized nanocrystalline copper film that were otherwise undetectable. Heat treatment resulted in increased oxidation and phase transition from multiphase to single CuO phase that was in situ observed by temperature‐dependent Raman measurements. Detailed understanding of the film properties and substrate interaction was made by using several characterization techniques.

中文翻译：

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在部分氧化的铜薄膜中的表面增强共振拉曼散射

通常可以从纳米晶半导体薄膜中获得宽而低强度的拉曼峰。固有的弱拉曼散射现象会由于不需要的背景信号而进一步恶化，从而阻止了对分析物的成功拉曼分析。在这项研究中，共振和表面增强拉曼散射技术相结合，以检测部分氧化的纳米晶体铜膜中的CuO和Cu ₂ O相，否则它们是无法检测到的。热处理导致增加的氧化和从多相到单相CuO的相变，这是通过依赖温度的拉曼测量原位观察到的。通过使用几种表征技术，可以对薄膜的特性和基材之间的相互作用有更深入的了解。